Gertner Institute Summer School on Nano Medicine, June 2016

Gertner Institute Summer School on Nano Medicine, June 2016

Chaoul 8th Annual Workshop, Hagoshrim 2012

Chaoul 8th Annual Workshop, Hagoshrim 2012

Chaoul 9th Annual Workshop, Nazareth 2013

Chaoul 9th Annual Workshop, Nazareth 2013

XIN inauguration ceremony, May 2014

XIN inauguration ceremony, May 2014

Near Field Scanning Optical Microscopy (NSOM) system

NSOM
Description:

The MultiView 2000TM series is a premium ultra-sensitive scanned probe microscope with a variety of modes of AFM/SPM/NSOM imaging. The MultiView 2000TM can achieve integration with AFM/SPM, without compromising optical performance. Nanonics has designed The MultiView 2000TM for excellence in scanned probe microscopy while allowing for near-field and far-field optical NSOM/Raman imaging without perturbation.

Specialized Scanning:

- Two award-winning Nanonics' FlatScanTM stages for Tip and
Sample Scanning.

- Up to 100 microns in X,Y & Z axis per scanner.

- Up to 200 microns in X,Y & Z axis in combined scanners.

- High step resolution and high resonance frequency.

- Unique Large Z range of 100 ┬Ám.

Feedback:

- The accepted ultimate in feedback of tuning forks without any optical
interference.
Optical & other Online

Integrations:

- Free optical axis for transparent integration with true confocal optical
microscopes of upright, inverted and dual configurations.

- Powerful objectives of high magnification (100x) and Large NA (0.75)
including water immersion objectives from top.

- Raman microscopes, electron and ion optical microscopes, environmental
glove box and high vacuum chambers.
Samples:

- Odd size and large samples including hanging geometries.

Probes:

All forms of cantilevered glass probes from Nanonics' exclusive NanoToolKitTM; Nanosensors including Akiyama tuning forks probes and Si probes.