Gertner Institute Summer School on Nano Medicine, June 2016

Gertner Institute Summer School on Nano Medicine, June 2016

Chaoul 8th Annual Workshop, Hagoshrim 2012

Chaoul 8th Annual Workshop, Hagoshrim 2012

Chaoul 9th Annual Workshop, Nazareth 2013

Chaoul 9th Annual Workshop, Nazareth 2013

XIN inauguration ceremony, May 2014

XIN inauguration ceremony, May 2014

JSM-6700 Field Emission Scanning Electron Microscope

jsm-6700
Description:

The JSM-6700F is a high resolution, easy-to-operate scaning electron microscope, based on a new cold filed emission gun electron source and employing state-of-the-art computer control and imaging. A conical FE gun and semi-inlens objective generate high resolution images. High definition, flicker-free images are displayed at 1280*1024 pixels and can easily be viewed under normal room lightting, even at slow scan speeds. A mouse and menu GUI interface, running under  Windows 7, provides a familiar control interface and high performance networking.

Specifications:
Features & Info sheet:
  • Resolution: 1.0nm (at 15kV), 2.2nm (at 1kV)

  • Magnification: 25 to 19,000 (LM mode), 100 to 650,000 (SEM mode)

  • Accelerating voltage: 0.5 to 30kV

  • Specimen illumination current: 10^-13A to 2*10^-9A

  • Electron gun: cold cathode field emission type

  • Alignment: Electromagnetic deflection system

  • Objective lens: Strongly excited conical lens

  • Specimen chamber: Large chamber for 200mm specimen

Modes of Operation:
  1. Secondery electron (SE) mode with two JEOL detectors: Lower SE detector + In-Lens detector with voltage filter.

  2. Backscattered Electron (BSE) mode with a retractable solid state BSE JEOL detector.

  3. Element Analysis mode: VANTAGE X-ray microanalysis system of THERMONORAN provides element identification, quantitative microanalysis and mapping down beryllium.

a few SEM images