Gertner Institute Summer School on Nano Medicine, June 2016

Gertner Institute Summer School on Nano Medicine, June 2016

Chaoul 8th Annual Workshop, Hagoshrim 2012

Chaoul 8th Annual Workshop, Hagoshrim 2012

Chaoul 9th Annual Workshop, Nazareth 2013

Chaoul 9th Annual Workshop, Nazareth 2013

XIN inauguration ceremony, May 2014

XIN inauguration ceremony, May 2014

Philips Tecnai F20 TEM

f20

Description:
With its 200 kv acceleration voltage and its Schottky field emission source, this instrument provides a unique combination of outstanding robustness, ease-of-use and high-resolution performance in micro-analysis and TEM imaging. The standard version of the microscope incorporates well-proven advanced technologies:
  • a Schottky field emission source giving ultra-high brightness, low energy spread and very small probe sizes.
  • an S-TWIN objective lens for high resolution at high tilts (maximum 40°).
  • a CompuStage for accurate specimen control and exceptional mechanical stability.
  • for ultra-high resolution analytical microscopy the Tecnai F20 can be equipped with embedded digital STEM, EDX and Energy Filter or PEELS.
Specifications:


Features & Info sheet:
Electron source:
  • Schottky Field emitter
  • High maximum beam current (> 100 nA)
  • High current in probe (0.5 nA or more in 1 nm probe)
  • Small energy spread (0.7 eV or less)
  • High stability and long life
Imaging:
  • Patented S-TWIN objective lens (TWIN objective available)
  • High tilt (40°) and large field of view (70° tilt for TWIN)
  • Unsurpassed information limit (0.12 nm achievable)
  • Coma-free alignment for high-resolution objective-lens centring
  • Rotation-free magnification and diffraction series
  • Magnification reproducible within 1.5 %
  • Embedded CCD camera
  • Plate camera with 56 sheets of film
STEM:
  • Bright Field and Annular Dark Field mode
  • Ultra-high Resolution STEM HAADF detector
  • Magnification range up to 10 000 kx
  • Resolution of 0.2 nm (S-TWIN)
Micro-analysis:
  • Excellent EDX in-hole performance
  • Low system background in EDX
  • Small probes (< 0.3 nm)
  • Embedded EDX, PEELS and Energy Filter
  • Embedded EDX and EELS spectrum profiling and imaging
Specimen stage:
  • Fully computer-controlled, eucentric side-entry, high-stability CompuStage
  • Maximized tilts for any X, Y, Z, a, b combination
  • Choice of a variety of specimen holders including low-background double-tilt holder
  • X, Y movement 2 mm, specimen size 3 mm
  • Specimen recall reproducibility <= 0.1 um (X, Y) and <= 0.1° (a tilt) attainable
  • Drift < 0.5 nm/minute with a standard holder
Vacuum:
  • Fully interlocked, differentially pumped column.
  • Oil-free vacuum system with turbo molecular pump, pre-pumping column, gun and specimen airlock
  • Liner tubes pumped by additional Ion Getter Pump
  • Ultra-high vacuum for contamination-free observation
  • Vacuum levels: specimen chamber 2.7 x 10^-5 Pa; gun 5 x 10^-7 Pa
  • Plate camera exchange with-out switching off High Tension and emitter