Transmission Electron Microscopy (TEM)

JEOL JEM-2010F STEM (JEOL, Japan, 1997).

Field emission gun scanning and transmission electron microscope.

• Schottky S-FEG.

• Routinely operated at 200 kV and 80 kV in both TEM and STEM modes.

• UHR objective lens for enhanced resolution images.

• Main characteristics at 200 kV: Cs=0.5 mm (!), point-to-point resolution of 0.19 nm, information limit of 0.1 nm.

• Electron diffraction patterns distortion < 1%.

• Thermo Noran System Six. (Thermo, USA) energy dispersive spectrometer for chemical analysis with an energy resolution of ~148 eV; classical SiLi detector, with a collection angle of ~0.13 sterad and a take-off angle of ~15 deg)

• Tridiem 863 (Gatan, USA) electron energy loss spectrometer, equipped with US1000 (2K x 2K) CCD camera; dedicated for very high-spatial resolution spectroscopic and electron energy filtered imaging analysis; best energy resolution (limited by the electron source) ~0.7 eV.

• JEOL Bi-Prism for electron holographic measurements with a phase resolution of ~100 mrad at medium and low magnifications.

• Dedicated specimen holders (manufactured by Gatan, USA):

  • Low background double tilt analytical holder (with Faraday cup).

  • Liquid nitrogen cooled single tilt analytical holder (also low background).

• Note: currently, the resolution of the system is slightly off, due to a fault in the HT tank.

Link to the manufacturer website, for general information >>

Multidisciplinary Research Building, room #009.

Multidisciplinary Research Building, room #009.