Tool Owner:
Dr. George Levi (georgelevi@tauex.tau.ac.il)
Manufacturer and model
|
JEOL JEM-2010F STEM (JEOL, Japan, 1997).
|
Talos F200i (Thermo Fisher Scientific, US, coming soon). |
Description |
Field emission gun scanning and transmission electron microscope.
|
Field emission gun scanning and transmission electron microscope. |
Specification |
-
Schottky S-FEG.
-
Routinely operated at 200 kV and 80 kV in both TEM and STEM modes.
-
UHR objective lens for enhanced resolution images.
-
Main characteristics at 200 kV: Cs=0.5 mm (!), point-to-point resolution of 0.19 nm, information limit of 0.1 nm.
-
Electron diffraction patterns distortion < 1%.
-
Thermo Noran System Six. (Thermo, USA) energy dispersive spectrometer for chemical analysis with an energy resolution of ~148 eV; classical SiLi detector, with a collection angle of ~0.13 sterad and a take-off angle of ~15 deg)
-
Tridiem 863 (Gatan, USA) electron energy loss spectrometer, equipped with US1000 (2K x 2K) CCD camera; dedicated for very high-spatial resolution spectroscopic and electron energy filtered imaging analysis; best energy resolution (limited by the electron source) ~0.7 eV.
-
JEOL Bi-Prism for electron holographic measurements with a phase resolution of ~100 mrad at medium and low magnifications.
-
Dedicated specimen holders (manufactured by Gatan, USA):
-
Note: currently, the resolution of the system is slightly off, due to a fault in the HT tank.
|
Link to the manufacturer website, for general information >>
|
Location |
Multidisciplinary Research Building, room #009.
|
Multidisciplinary Research Building, room #009.
|