Transmission Electron Microscopy (TEM)

Transmission Electron Microscopy (TEM)

Tool Owner:

Dr. George Levi (georgelevi@tauex.tau.ac.il)

 

Manufacturer and model

JEOL JEM-2010F STEM (JEOL, Japan, 1997).

Talos F200i (Thermo Fisher Scientific, US, coming soon).
Description

Field emission gun scanning and transmission electron microscope.

Field emission gun scanning and transmission electron microscope.
Specification
  • Schottky S-FEG.

  • Routinely operated at 200 kV and 80 kV in both TEM and STEM modes.

  • UHR objective lens for enhanced resolution images.

  • Main characteristics at 200 kV: Cs=0.5 mm (!), point-to-point resolution of 0.19 nm, information limit of 0.1 nm.

  • Electron diffraction patterns distortion < 1%.

  • Thermo Noran System Six. (Thermo, USA) energy dispersive spectrometer for chemical analysis with an energy resolution of ~148 eV; classical SiLi detector, with a collection angle of ~0.13 sterad and a take-off angle of ~15 deg)

  • Tridiem 863 (Gatan, USA) electron energy loss spectrometer, equipped with US1000 (2K x 2K) CCD camera; dedicated for very high-spatial resolution spectroscopic and electron energy filtered imaging analysis; best energy resolution (limited by the electron source) ~0.7 eV.

  • JEOL Bi-Prism for electron holographic measurements with a phase resolution of ~100 mrad at medium and low magnifications.

  • Dedicated specimen holders (manufactured by Gatan, USA):

    • Low background double tilt analytical holder (with Faraday cup).

    • Liquid nitrogen cooled single tilt analytical holder (also low background).

  • Note: currently, the resolution of the system is slightly off, due to a fault in the HT tank.

Link to the manufacturer website, for general information >>

Location

Multidisciplinary Research Building, room #009.

Multidisciplinary Research Building, room #009.

 

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