I-V/C-V Meter Keithley 4210

Manufacturer and model:

Keithley 4200A I-V/C-V meter

Description:

An easy configurable electrical test system, integrating multiple DC source/meter units, AC impedance meter, interactive software, graphics, and analysis capabilities, simplifying sensitive current-voltage (I-V) and capacitance-voltage (C-V) measurements.

Specification:

1. 4200A-SCS Parameter Analyzer with the following units:

• 4200-SMU SOURCE MEASURE UNITS ´ 6: I-V DC sources (±200V, 1A)/I and V meters.
• 4200-PA PREAMP ´ 2: Preamp for SMUs, adds 5 ranges with 10aA resolution.
• 4210-CVU CAPACITANCE-VOLTAGE UNIT: AC impedance meter: 1kHz to 10MHz, 100mV AC Drive.
• 4200A-CVIV MULTI-SWITCH: Enables switching between I-V and C-V measurements; 2 or 4-wire connections.

2. EPS150TRIAX - A dedicated manual probing solution for low-noise I-V/C-V tests

• MPS150 probe station: 150 mm chuck stage, universal platen with 40 mm height adjustment.
• DPP210-M-S positioners: with triax probe arms, 2 m triax cables, 6 μm tip radius probe tips.
• Stereo zoom microscope: 15x - 100x magnification and LED illumination.
• Triaxial chucks:  triax cables (force/sense); with vacuum, maximum theta range +/- 8°.
• Vibration-isolation solution.
   

Applications:

• Device modeling.
• Process development.
• Characterization.
• Reliability.
• Lifetime testing.
• Failure analysis, etc.

Materials:

• Semiconductors.
• Organic semiconductors.
• Metals.
• Semimetals.
• Oxides, transparent conductive oxides.
• Nanocomposites.
• Metamaterials.
• 2D materials, etc.

Devices:

• Resistors (thermo, 4point, Hall bar, Wan der Pauw, magneto, etc.).
• Capacitors (MOS, MIS, MIMs, CCDs).
• Diodes (PN, PIN, Zener, avalanche, Schottky, photodiodes, solar cells).
• Transistors (MOSFET, HFET, TFFET, BJT, OFET, BioFETs,  HEMT, etc.).
• Memory devices.
• Batteries.
• MEMS devices
• Image sensors.
• Bio sensors, etc.

​Location:

Glove box lab, Nano center building.

Tool Owner:

Anastasia Adelberg (anastasiia@tauex.tau.ac.il).

Tool Trainer:

Anastasia Adelberg (anastasiia@tauex.tau.ac.il).