I-V/C-V Meter Keithley 4210
Manufacturer and model:
Keithley 4200A I-V/C-V meter
Description:
An easy configurable electrical test system, integrating multiple DC source/meter units, AC impedance meter, interactive software, graphics, and analysis capabilities, simplifying sensitive current-voltage (I-V) and capacitance-voltage (C-V) measurements.
Specification:
1. 4200A-SCS Parameter Analyzer with the following units:
- 4200-SMU SOURCE MEASURE UNITS ´ 6: I-V DC sources (±200V, 1A)/I and V meters.
- 4200-PA PREAMP ´ 2: Preamp for SMUs, adds 5 ranges with 10aA resolution.
- 4210-CVU CAPACITANCE-VOLTAGE UNIT: AC impedance meter: 1kHz to 10MHz, 100mV AC Drive.
- 4200A-CVIV MULTI-SWITCH: Enables switching between I-V and C-V measurements; 2 or 4-wire connections.
2. EPS150TRIAX - A dedicated manual probing solution for low-noise I-V/C-V tests
- MPS150 probe station: 150 mm chuck stage, universal platen with 40 mm height adjustment.
- DPP210-M-S positioners: with triax probe arms, 2 m triax cables, 6 μm tip radius probe tips.
- Stereo zoom microscope: 15x - 100x magnification and LED illumination.
- Triaxial chucks: triax cables (force/sense); with vacuum, maximum theta range +/- 8°.
- Vibration-isolation solution.
Applications:
- Device modeling.
- Process development.
- Characterization.
- Reliability.
- Lifetime testing.
- Failure analysis, etc.
Materials:
- Semiconductors.
- Organic semiconductors.
- Metals.
- Semimetals.
- Oxides, transparent conductive oxides.
- Nanocomposites.
- Metamaterials.
- 2D materials, etc.
Devices:
- Resistors (thermo, 4point, Hall bar, Wan der Pauw, magneto, etc.).
- Capacitors (MOS, MIS, MIMs, CCDs).
- Diodes (PN, PIN, Zener, avalanche, Schottky, photodiodes, solar cells).
- Transistors (MOSFET, HFET, TFFET, BJT, OFET, BioFETs, HEMT, etc.).
- Memory devices.
- Batteries.
- MEMS devices
- Image sensors.
- Bio sensors, etc.
Location:
Glove box lab, Nano center building.
Tool Owner:
Anastasia Adelberg (anastasiia@tauex.tau.ac.il).
Tool Trainer:
Anastasia Adelberg (anastasiia@tauex.tau.ac.il).