I-V/C-V Meter Keithley 4210

Specification:

1. Parameter Analyze with the following units:

• Source measure units: I-V DC sources (±200V, 1A)/I and V meters.
• Preamp for SMUs, adds 5 ranges with 10aA resolution.
• Capacitance-voltage unit: AC impedance meter, 1kHz to 10MHz, 100mV AC Drive.
• Multi-Switch: Enables switching between I-V and C-V measurements.

2. A dedicated manual probing solution for low-noise I-V/C-V tests

• 150 mm chuck stage, universal platen with 40 mm height adjustment.
• Triax probe arms, 2 m triax cables, 6 μm tip radius probe tips.
• Stereo zoom microscope: 15x - 100x magnification and LED illumination.

Applications:

• Device modeling.
• Process development.
• Characterization.
• Reliability.
• Lifetime testing.
• Failure analysis, etc.

Materials:

Semiconductors, Organic semiconductors, Metals, Semimetals, Oxides, transparent conductive oxides, Nanocomposites, Metamaterials, 2D materials, etc.

Devices:

• Resistors (thermo, 4point, Hall bar, Wan der Pauw, magneto, etc.).
• Capacitors (MOS, MIS, MIMs, CCDs).
• Diodes (PN, PIN, Zener, avalanche, Schottky, photodiodes, solar cells).
• Transistors (MOSFET, HFET, TFFET, BJT, OFET, BioFETs,  HEMT, etc.).
• Memory devices.
• MEMS devices
• Image sensors.
• Bio sensors, etc.