Characterization
Dual Beam FIB and HR-SEM, Helios 5 UCThe Helios 5 is an integrated focused ion beam (FIB) and scanning electron beam, dual functionality in one machine.
Roy Davidi | 03-6409949 | roydavidi@tauex.tau.ac.il
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Profilometer KLA
Erez Benjamin | (erezbenj@mail.tau.ac.il)
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Profilometer DEKTAK
Dr. Boris Yofis | 03-6407718 | boris.yofis@gmail.com
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Ellipsometer Woolam
Sergio Bloch | 03-6404262 | csebta@tauex.tau.ac.il
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Confocal Microscope Olympus LEXT 4000
Erez Benjamin | (erezbenj@mail.tau.ac.il)
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HRSEM ZEISS Gemini 300
Dr. Pini Shekhter | 03-6407817 | shpini@tauex.tau.ac.il |
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AFM
Anastasia Adelberg | 03-6405710 | anastasiia@tauex.tau.ac.il
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I-V/C-V meter Keithley 4210
Anastasia Adelberg | 03-6405710 | anastasiia@tauex.tau.ac.il
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Probe Station Eng
Dr. Valery Garber | 03-6405713 | Valeryg@tauex.tau.ac.il
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4 Point Probe
Dr. Valery Garber | 03-6405713 | Valeryg@tauex.tau.ac.il
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LAMBDA™ 1050 - UV/Vis/NIR Spectrophotometer
Dr. Valery Garber | 03-6405713 | Valeryg@tauex.tau.ac.il
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Contact Angle
Nicole Gorokhovsky | nicolegoro@mail.tau.ac.il
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NanoDrop
Nicole Gorokhovsky | nicolegoro@mail.tau.ac.il
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DLS
Nicole Gorokhovsky | nicolegoro@mail.tau.ac.il |
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Raman Spectroscopy
Anastasia Adelberg | 03-6405710 | anastasiia@tauex.tau.ac.il
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Transmission Electron Microscopy (TEM)
Dr. George Levi | 03-6409205 | georgelevi@tauex.tau.ac.il
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Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Dr. Alexander Gladkikh | 03-6406635 | alexgl@post.tau.ac.il
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Environmental Scanning Electron Microscope (ESEM)
Dr. Zahava Barkay | 03-6407818 | barkay@tauex.tau.ac.il
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X-ray Photoelectron Spectrometer Microprobe (XPS) and multi-technique surface analysis instrument
Dr. Pini Shekhter | 03-6407817 | shpini@tauex.tau.ac.il
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X-ray Diffraction (XRD)
Dr. Davide Levy | 03-6407815 | davide@tauex.tau.ac.il
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FTIR spectrophotometer
Dr. Valery Garber | Valeryg@tauex.tau.ac.il
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