Characterization
Helius 5 Dual Beam FIB ThermoFisherThe Helios 5 is an integrated focused ion beam (FIB) and scanning electron beam, dual functionality in one machine.
Roy Davidi | 03-6409949 | roydavidi@tauex.tau.ac.il
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Profilometer KLA
Erez Benjamin | (erezbenj@mail.tau.ac.il)
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Profilometer DEKTAK
Dr. Gal Radovsky | 03-6405734 | galradovsky@tauex.tau.ac.il
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Ellipsometer Woolam
Dr. Gal Radovsky | 03-6405734 | galradovsky@tauex.tau.ac.il
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Confocal Microscope Olympus LEXT 4000
Erez Benjamin | (erezbenj@mail.tau.ac.il)
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HRSEM ZEISS Gemini 300
Dr. Gal Radovsky | 03-6405734 | galradovsky@tauex.tau.ac.il |
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AFM
Dr. Gal Radovsky | 03-6405734 | galradovsky@tauex.tau.ac.il
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Keithley Electrical Parameter Analyzer
Dr. Valery Garber | 03-6405713 | Valeryg@tauex.tau.ac.il
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Probe Station Eng
Dr. Valery Garber | 03-6405713 | Valeryg@tauex.tau.ac.il
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4 Point Probe
Dr. Valery Garber | 03-6405713 | Valeryg@tauex.tau.ac.il
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FTIR spectrometer Bruker
Read more>> Dr. Gal Radovsky | 03-6405734 | galradovsky@tauex.tau.ac.il
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Contact Angle
Nirit Porecki-Shamay | 03-6404262 | nporecki@tauex.tau.ac.il
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NanoDrop
Roman Nudelman | romanhud@mail.tau.ac.il
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DLS
Dr. Gal Radovsky | 03-6405734 | galradovsky@tauex.tau.ac.il
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Raman Spectroscopy
Dr. Gal Radovsky | 03-6405734 | galradovsky@tauex.tau.ac.il
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Transmission Electron Microscope (TEM)
Dr. George Levi | 03-6409205 | georgelevi@tauex.tau.ac.il
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Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Dr. Alexander Gladkikh | 03-6406635 | alexgl@post.tau.ac.il
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Environmental Scanning Electron Microscope (ESEM)
Dr. Zahava Barkay | 03-6407817 | barkay@tauex.tau.ac.il
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X-ray Photoelectron Spectrometer Microprobe (XPS) and multi-technique surface analysis instrument
Dr. Pini Shekhter | 03-6407818 | shpini@tauex.tau.ac.il
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X-ray Diffraction (XRD)
Dr. Davide Levy | 03-6407815 | davide@tauex.tau.ac.il
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