Fabrication Metrology
TAU.nano offering a comprehensive suite of advanced fabrication metrology tools, including the Profilometer, Confocal Microscope, and Ellipsometer, to support cutting-edge research and innovation in nanotechnology
Profilometer KLA |
 |
Profilometer DEKTAK |
.png "Profilometer DEKTAK") |
Confocal Microscope Olympus LEXT 5100
|
 |
4 Point Probe |
 |
Probe Station Eng
|
 |
I-V/C-V meter Keithley 4210
|
 |
Spectroscopic Ellipsometer - Wollam
|
 |
Raman Spectroscopy
|
 |
Back to Characterization Lobby >>
Read More
