Fabrication Metrology
TAU.nano offering a comprehensive suite of advanced fabrication metrology tools, including the Profilometer, Confocal Microscope, and Ellipsometer, to support cutting-edge research and innovation in nanotechnology
KLA P-17 Mechanical Stylus Profilometer |
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Profilometer DEKTAK |
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Confocal Microscope Olympus LEXT 5100
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4 Point Probe |
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Probe Station Eng
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I-V/C-V meter Keithley 4210
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Spectroscopic Ellipsometer - Wollam
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Bruker INVENIO-S Fourier Transform Infrared (FTIR) Spectrometer
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Raman Spectroscopy
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