Ellipsometer Woollam

Manufacturer and model:

J.A. Woollam Co., Inc Spectroscopic Ellipsometer M-2000D.

Description:

The M-2000 is most commonly used to measure thin film thickness and optical constants, making it a reliable ellipsometer tool for both research and industry.

It is sensitive to less than a monolayer of material (sub-nm) on a surface and yet can determine thickness for transparent films up to tens of microns. Through advanced ellipsometer analysis, users gain precise data on film uniformity and optical properties, ensuring accurate characterization of materials.