Ellipsometer Woollam

Ellipsometer Woollam
Ellipsometer Woollam
  • Description
  • Specification
  • Location & Tool Owner


J.A. Woollam Co., Inc Spectroscopic Ellipsometer M-2000D.


The M-2000 is most commonly used to measure thin film thickness and optical constants.


It is sensitive to less than a monolayer of material (sub-nm) on a surface and yet can determine thickness for transparent films up to tens of microns.


Tel Aviv University makes every effort to respect copyright. If you own copyright to the content contained
here and / or the use of such content is in your opinion infringing, Contact us as soon as possible >>