AFM

AFM
AFM

Manufacturer and model:

AFM NX12 from Park Systems.

 

Description:

Measuring of surface topography with atomic resolution, surface roughness, mechanical material constants (such as Young modulus, elasticity, etc.), electrical material parameters (localized charge, surface potential distribution, etc.)

 

Specification:

Atomic force microscope capable of working in non-contact, tapping, and contact modes.

The machine is coupled to an optical microscope with a top view as well as inverted light, which is convenient for all types of samples.

Location:

Nano Center Building, Room #18.

 

Tool Owner:

Dr. Anastasia Adelberg  anastasiia@tauex.tau.ac.il

 

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