Manufacturer and model:
AFM NX12 from Park Systems.
Measuring of surface topography with atomic resolution, surface roughness, mechanical material constants (such as Young modulus, elasticity, etc.), electrical material parameters (localized charge, surface potential distribution, etc.)
Atomic force microscope capable of working in non-contact, tapping, and contact modes.
The machine is coupled to an optical microscope with a top view as well as inverted light, which is convenient for all types of samples.
Nano Center Building, Room #18.
Dr. Anastasia Adelberg firstname.lastname@example.org