Material Analysis

TAU.nano provides a range of sophisticated material analysis tools, such as XPS, XRD, TOF-SIMS, and AFM, designed to advance the frontiers of nanotechnology research and innovation

 
 

X-ray Photoelectron Spectrometer Microprobe (XPS) and multi-technique surface analysis instrument

 

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 XPS
 
 
 

X-ray Diffraction (XRD)

 

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 X-ray Diffraction (XRD)
 
 
 

DLS

 

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 DLS
 
 
 

Contact Angle

 

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 Contact Angle
 
 
 

LAMBDA™ 1050 - UV/Vis/NIR Spectrophotometer

 

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 LAMBDA™ 1050 - UV/Vis/NIR Spectrophotometer
 
 
 

Raman Spectroscopy

 

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 Raman Spectroscopy
 
 
 

Bruker INVENIO-S Fourier Transform Infrared (FTIR) Spectrometer

 

Technical Info >>		 Bruker INVENIO-S Fourier Transform Infrared (FTIR) Spectrometer
 
 

 

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