Material Analysis
TAU.nano provides a range of sophisticated material analysis tools, such as XPS, XRD, TOF-SIMS, and AFM, designed to advance the frontiers of nanotechnology research and innovation
X-ray Photoelectron Spectrometer Microprobe (XPS) and multi-technique surface analysis instrument |
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X-ray Diffraction (XRD) |
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Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
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AFM Park NX10 |
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AFM Park NX12
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DLS
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Contact Angle
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LAMBDA™ 1050 - UV/Vis/NIR Spectrophotometer
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FTIR spectrophotometer
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