Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS)

AES and XPS
AES and XPS

Manufacturer and model:

PHI 5600 ESCA multi-technique system.

 

Description:

XPS/AES system dedicated to surface science capable of measuring the atomic concentration as well as bonding of elements in the sample. This method is capable of measuring characterizing the surface of many different materials from a wide range of research fields: semiconductors, polymers, battery matter, medical and biomaterials, metals, ceramics and more.

Thanks to its surface sensitive nature (top ~7nm) this system allows for dedicated analysis of the surface.

 

Specification:

Technique

Information

Detection Limits

Imaging, mapping

Analysis area

AES

Elemental composition,  Li-U

0.1-1 at%

yes

≥100 nm

XPS

Elemental composition and chemical bonding  Li-U

0.05-1 at%

no

30μm – 2 mm

XPS/AES Examples of Activity.

 

Location:

Multidisciplinary Research Building, Room #003.

 

Tool Owner:

Dr. Pini Shekhter (shpini@tauex.tau.ac.il).

 

Rates & Costs for external Commercial / Industrial:

800 NIS / hr.

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