AFM Park NX12

Specification:

Atomic force microscope capable of working in non-contact, tapping, and contact modes.
The machine is coupled to an optical microscope with a top view as well as inverted light,
which is convenient for all types of samples.
Scan sizes up to 100x100 microns.

Samples:

Sample dimensions 50x50 mm or less. The height from peak to valley is up to 5 microns.

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